updated 10:40 pm EDT, Mon October 4, 2010
Process mode improved, metadata support expanded
ACD Systems has released an update to its photography workflow utility, ACDSee Pro for Mac. Beta 1.4 brings several new features, including non-destructive editing. The user interface has also been improved for the Process mode, allowing users to easily copy and paste processing settings between images.
The developer has expanded support for IPTC Core, Extended and IIM metadata standards, which are handled in compliance with Metadata Working Group interoperability specifications. Users can now take advantage of a Custom Metadata pane for quick access to important data. Version 1.4 also adds support for XMP sidecar files, enabling XMP data to be tied to unsupported file formats.
The beta offers many of the same features as its Windows-based counterpart, ACDSee Pro 3. The software provides tools for managing, editing, viewing, processing or printing images. Version 1.3 opened up the Process mode, which includes a variety of utilities for lens correction, noise reduction, and color correction, among other features. Users can manage content stored on local drives, or external sources such as connected devices or external drives.
Version 1.4 is still under development as a free public beta.